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Force and mechanical measuring equipment
Chroma 3650 test applications for different types of devices with flexible configurations, especially suitable for testing power management chips and ICs. With a variety of VI, HDDPS2, HVVI, PVI100 and MPVI boards, the 3650 can meet high-precision, high-voltage and high-current testing requirements. The Chroma 3650 tester has high speed and parallel testing capabilities, providing the most cost-effective solution for non-chip manufacturing companies, IDMs and testers.
With full testing functions, high accuracy, powerful software tools and excellent reliability, Chroma 3650 is the testing solution for all high performance devices, microcontrollers, ICs Likewise, your consumer SoC devices and wafer sorting applications.
Chroma 3650 is specifically designed for fast and highly parallel testing to provide the most cost-effective solution for non-chip manufacturing companies, IDMs and testers. With comprehensive test coverage, high accuracy, powerful software tools, and excellent reliability, the Chroma 3650 is ideal for testing power management devices, analog devices, and semiconductors. MCU compounds and devices.
Chroma 3650 offers a wide range of VI, HDDPS2, HVVI, VI45, PVI100 and MPVI functional boards, including high density, wide voltage and current supply range, and high precision measurement, up to 768 pins Digital I/O, VI pins, and analog test capabilities, deliver superior test performance and high throughput in a cost-effective test solution.
The Chroma 3650 with multi-purpose test pins can perform the same parametric tests on multiple pins simultaneously. Chroma 3650 integrates 64 digital pins on a single LPC board. Each LPC board contains 16 high-performance PINF ICs, supporting 4 clocking channels.
The integrated control circuit manages resource allocation and readout results, reducing the work load on the system controller. The Chroma 3650's any-pin-to-any-position mapping design provides up to 32 positions with high-throughput parallel testing for enhanced batch testing, layout flexibility, and visualization.
The semiconductor industry is evolving at a rapid pace, and devices must be built to span multiple generations and applications to be worth the cost of ownership. With multiple options, such as AD/DA converter testing, ALPG for memory testing, high voltage PE, diverse scan chain testing, as well as similar options, the Chroma 3650-S2 ensures that it will serve you for many years to come.
Chroma 3650's platform architecture allows for easy integration of specialized tools developed by third-party vendors for specific applications. This system is capable of serving many different devices, and is a low-cost production inspection system.
With its compact and air-cooled design, the Chroma 3650 delivers high-speed, integrated capabilities on a minimal floor space. With different controllers, the Chroma 3650 can be used for both packaged product inspection and wafer inspection.
Chroma 3650 has a powerful software toolset using the “Chroma Integrated Software Platform” (CRISP). In addition to easy-to-use test programming functionality, CRISP provides all your test debugging, production, and data analysis needs. CRISP also integrates all software functions for programming test programs, controlling test execution, data analysis and test machine management into a single software suite. Based on the Microsoft Windows operating system and the C++ programming language, CRISP provides users with powerful, fast and intuitive user interface tools. In the IDE Project tool, test developers can easily switch between standard templates, user-defined templates, and a C++ code-based editor to quickly and automatically create their test programs. extends to multi-site parallel testing. Furthermore, CRISP provides test program and test template conversion tools to easily convert tests from other test platforms to the 3650 format.
The test program execution controller is equipped with two switchable tools, the Systtem Control tool and the Plan Debugger tool, allowing users to operate more efficiently in normal or debug mode. In the Plan Debbuger tool, users can control the execution of a test program by setting breakpoints, stepping, stepping in, stepping through, resuming execution, monitoring variables, and editing variables. For test debugging and data analysis, CRISP provides a variety of software utility tools. The Datalog, Waveform and Scope tools are designed to support clear display of digital waveforms and measurement data. To find the parameter margin, SHMOO and Pin Margin tools can easily perform debugging through automatic or manual mode. Wafer Map, Summary, Histogram and STDF tools are useful for collecting test results and analyzing effective parametric characterization.
Test Conditioning Monitor and Pattern Editor tools provide out-of-the-box functionality for real-time debugging and allow users to change test conditions or sample data without interrupting testing or editing files source. CRISP also comes with ADDA tool and Bit Map tool for analog and ALPG options. With the ADDA tool, users can not only view AD/DA test results graphically, but can also easily create their own ADC samples. This powerful and comprehensive GUI toolkit will surely serve all your needs related to test debugging and test report generation.
OCI Tools is CRISP's solution for mass production. It allows easy and precise operation, the most important requirement for the production process. Programmers can adjust the OCI engine using the Production Setup menu to meet the requirements of the pre-production environment. All the operator needs to do is select the intended process and start mass production.
The Chroma 3650 provides multiple drivers for interfacing with the processor and probe via GPIB and TTL interfaces. Supported processors and transducers include CHROMA, SEIKO-EPSON, HONTECH, SHIBASOKU, MULTITEST, ASECO, DAYMARC, TEL, TSK and OPUS. In addition, 3650 also provides conversion board solutions for existing test platforms to facilitate test platform migration and reduce costs for users. This adapter board allows the 3650 to directly accept the DIB and probe cards of other testers, saving the cost of manufacturing new load boards and probe cards.
Design custom applications
Chroma provides application deployment support to both new and existing customers. Upon request, Chroma can provide customized support based on your specific needs. Whether you need to increase production, take advantage of emerging market opportunities, improve productivity, or reduce inspection costs with innovative strategies, Chroma's global customer support team is committed to creating provide timely and effective solutions for you.
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► Please re-calibrate after use for a certain period through our purchase store. Local Vietnam : SEMIKI CORP
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Semiki instrumentation Co., Ltd
Email: sales@semiki.com
Office tel: +84 28 2253 3522
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SoC test system
SoC test system
SoC test system
SoC test system
SoC test system