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Home / Shop / SEMIKI measurement solution / SoC test system / Chroma 3650-EX Cost-effective SoC/Analog chip testing system
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Chroma 3650-EX Cost-effective SoC/Analog chip testing system

Producer:

Chroma 3650-EX is specifically designed for parallel testing and multi-station testing capabilities to provide a cost-effective solution for fabless companies, IDMs and inspectors. With full test functionality, high accuracy, powerful software tools and excellent reliability, the Chroma 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoCs.

Main features of the Chroma 3650-EX device:

  • 10 general-purpose slots for digital, analog and hybrid applications
  • Clock rate 50/100 MHz, data rate 100/200 Mbps
  • Up to 512 parallel test stations
  • Up to 1024 digital I/O pins
  • Vector memory 32/64 MW
  • Up to 32 PMU channels for highly accurate measurement
  • Time measurement unit for each pin/PPMU/frequency measurement
  • SCAN function to 4G/chain scanning depth
  • ALPG option for memory testing
  • Edge position accuracy ±300ps
  • Up to 64 high voltage pins
  • 96 high-density DPS channels
  • 32-channel HDADDA mixed signal option
  • VI45 analog options from 8 to 32 channels
  • PVI100 analog options from 2 to 8 channels
  • MRX option for third-party PXI/PXIe applications
  • Microsoft Windows® 7 operating system
  • C++ programming interface and GUI
  • CRISP software, full suite of visualization tools
  • Convert test programs and samples for other platforms
  • Accept DIB and probe cards from other testers directly
  • Support STDF data output
  • Compact, air-cooled design for test head

Chroma 3650-EX is specifically designed for parallel testing and multi-station testing capabilities to provide a cost-effective solution for fabless companies, IDMs and inspectors. With full test functionality, high accuracy, powerful software tools and excellent reliability, the 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog device and SoC.

Furthermore, the powerful test library provides a diverse range of test templates to meet the requirements of complex tests. The test architecture deploys flexible footprints and site maps without limitations, designed for multi-device testing with high throughput capabilities. With up to 640 digital pins, 32 device supplies, a PMU for each pin, and analog test capabilities, the Chroma 3650-EX provides a combination of high test performance and throughput with an efficient test solution about costs.

Maintenance : 

► Please re-calibrate after use for a certain period through our purchase store. Local Vietnam : SEMIKI CORP

DISTRIBUTED BY:

Semiki instrumentation Co., Ltd

Email: sales@semiki.com

Office tel: +84 28 2253 3522

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SEMIKI MEASUREMENT EQUIPMENT COMPANY LIMITED
Headquarters:
  • Floor 12 – Tower A2, Viettel Building, 285 Cach Mang Thang Tam, Ward 12, District 10, Ho Chi Minh City, Vietnam
  • Sales@semiki.com
  • +84 979761016
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