Chroma 3650-S2 AI and IoT Chip Test System, SoC/Analog

Ability to test multiple devices simultaneously

The Chroma 3650-S2 features multi-purpose test pins that can perform the same parameter tests on multiple pins simultaneously. The Chroma 3650-S2 integrates 64 digital pins on a single LPC board. Each LPC board contains 16 high-performance PINF ICs, supporting 4 clock channels.

An integrated control circuit manages resource allocation and reading results, reducing the workload on the system controller. The Chroma 3650-S2's any-pin-to-any-location mapping design provides up to 32 locations with high-throughput parallel testing for enhanced batch testing, flexible layout, and intuitive operation.

Flexibility

The semiconductor industry is evolving at a rapid pace, and devices must be built to span multiple generations and applications to be worth the cost of ownership. With multiple options, such as AD/DA converter testing, ALPG for memory testing, high voltage PE, diverse scan chain testing, as well as similar options, the Chroma 3650-S2 ensures that it will serve you for many years to come.

The Chroma 3650-S2 platform architecture allows for easy integration of specialized tools developed by third-party vendors for specific applications. The system is capable of serving a wide variety of different devices, making it a low-cost production inspection system.

Compact size

With its compact, air-cooled design, the Chroma 3650-S2 delivers high speed, multiple integration capabilities on a minimal footprint. With a variety of controllers, the 3650-S2 can be used for both packaged product inspection and wafer inspection.

main function

12 general-purpose slots for digital, analog and mixed-signal applications
Up to 768 digital and analog I/O pins
Clock speed 50 / 100 MHz
Data rate 100 / 200 Mbps (MUX)
Edge placement accuracy ±300ps
32 MW vector memory
32 MW sample command memory
Measure frequency/PPMU on each pin
Features scanning to a depth of 2G per scan chain
ALPG option for memory testing
Up to 48 high-voltage I/O pins
Many VI floating land resources
64 channels/board for HDDPS2 DPS option
3000V max (stacked) for HVVI analog option
ASO mixed signal audio band test option with 8 AWG channels and 8 Digitizer channels
40A pulse at 60V for MPVI analog option
32 channels/board for VI45 analog option
8 channels/board for PVI100 analog option
Significantly increases the area of components on the load board (LB)
Larger power supply for tester
Microsoft Windows® 7 / Windows® 10 operating system
C++ programming interface and GUI
CRISP (full visualization software toolkit)
Converter of test programs and test templates from other platforms
Accepts DIB cards and probe cards of other testers by adding an adapter
Supports STDF data export
Air cooled, compact size

Powerful software toolkit – CRISP

The Chroma 3650-S2 features a powerful software toolkit using the “Chroma Integrated Software Platform” (CRISP). In addition to easy-to-use test programming, CRISP provides all the test debugging, production, and data analysis needs. CRISP also integrates all the software functions for test program programming, test execution control, data analysis, and test machine management into a single software suite. Based on the Microsoft Windows operating system and C++ programming language, CRISP provides users with powerful, fast, and intuitive user interface tools. In the Project IDE tool, test developers can easily switch between standard templates, user-defined templates, and a C++ code-based editor to quickly create their test programs and automatically scale to multi-site parallel testing. Additionally, CRISP provides test program and test template conversion tools to easily convert tests from other test platforms to the 3650-S2 format.

The test program execution controller is equipped with two switchable tools, the Systtem Control tool and the Plan Debugger tool, allowing users to operate more efficiently in normal or debug mode. In the Plan Debbuger tool, users can control the execution of a test program by setting breakpoints, stepping, stepping in, stepping through, resuming execution, monitoring variables, and editing variables. For test debugging and data analysis, CRISP provides a variety of software utility tools. The Datalog, Waveform and Scope tools are designed to support clear display of digital waveforms and measurement data. To find the parameter margin, SHMOO and Pin Margin tools can easily perform debugging through automatic or manual mode. Wafer Map, Summary, Histogram and STDF tools are useful for collecting test results and analyzing effective parametric characterization.

Test Conditioning Monitor and Pattern Editor tools provide out-of-the-box functionality for real-time debugging and allow users to change test conditions or sample data without interrupting testing or editing files source. CRISP also comes with ADDA tool and Bit Map tool for analog and ALPG options. With the ADDA tool, users can not only view AD/DA test results graphically, but can also easily create their own ADC samples. This powerful and comprehensive GUI toolkit will surely serve all your needs related to test debugging and test report generation.

OCI Tools is CRISP's solution for mass production. It allows easy and precise operation, the most important requirement for the production process. Programmers can adjust the OCI engine using the Production Setup menu to meet the requirements of the pre-production environment. All the operator needs to do is select the intended process and start mass production.

Chroma 3650-S2 provides multiple drivers for communication with processors and probes via GPIB and TTL interfaces. Supported processors and probes include CHROMA, SEIKO-EPSON, HONTECH, SHIBASOKU, MULTITEST, ASECO, DAYMARC, TEL, TSK and OPUS. In addition, the 3650-S2 also provides a conversion board solution for existing test platforms to facilitate test platform migration and reduce costs for users. This conversion board allows the 3650-S2 to directly accept DIB cards and probe cards from other testers, saving the cost of manufacturing new load boards and probe cards.

Design custom applications

Chroma provides application deployment support to both new and existing customers. Upon request, Chroma can provide customized support based on your specific needs. Whether you need to increase production, take advantage of emerging market opportunities, improve productivity, or reduce inspection costs with innovative strategies, Chroma's global customer support team is committed to creating provide timely and effective solutions for you.