Chroma 3680 high-end SOC chip testing system
The semiconductor manufacturing industry is growing rapidly, with more and more highly integrated devices with different functions. Machine tools must be built to last through multiple generations of equipment and applications. Chroma's SoC 3680 Test System offers flexible configurations and a wide test coverage to accommodate testing of various device types. The system flexibly deploys configurations of up to 2048 pins in 24 slots versatile with digital performance up to 1Gbps, maximum default vector memory of 256MW, ±150ps EPA for outstanding timing accuracy in high-speed applications, and offers many options such as HDADDA2 for control tra converter, HDVI for high voltage & automotive, HDAVO for high performance mixed signal with video applications of 400Msps AWG & 250Msps DIG and another high precision audio application of 24bits AWG & DIG. Additionally, HCDPS provides high current capability up to 32A per channel, and HDRF2 provides RF test functionality with 32 ports and 4 VSTs.
The Chroma 3680 also includes the main cabinet containing the AC and DC power distribution units and system supplies. An optional test head controller is provided for connection to automatic processing equipment.
This system is specifically designed for high throughput and highly parallel testing capabilities to provide the best solution for fabless companies, IDMs and testers. With a full range of test functions, high accuracy, powerful software and excellent reliability, the 3680 is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
Application of Chroma 3680
- Radio Frequency (RF)
- Internet of Things (IoT)
- Artificial Intelligence (AI)
- Microcontroller unit (MCU)
- Digital audio
- Digital TV (DTV)
- Signal decoder (STB)
- Digital Signal Processing (DSP)
- Network Processors and Field Programmable Gate Arrays (FPGAs)
Main features of the device
- 24 interchangeable slots for digital, analog and hybrid applications
- Data speed up to 1Gbps
- Up to 2048 parallel test stations
- Up to 2048 digital I/O pins
- Vector memory 256 MW (512 MW optional) (X2 mode)
- Up to 64 PMU channels for highly accurate measurement
- Time measurement unit for each pin/PPMU/frequency measurement
- SCAN up to 64 strings/16G depth
- Edge position accuracy (EPA): ±150ps
- Up to 128 high-density DPS32 channels
- High density HDADDA2 mixed signal option
- High performance and energy efficient HCDPS analog option
- High performance HDAVO option
- *Optional high density analog HDVI
- *High-density parallel HDRF option
- *Direct check system
- *Multiple time domain function
- Microsoft Windows® 10 operating system
- C#.NET programming interface and GUI
- CRISPro software, a full suite of visualization tools
- Convert test programs and samples for other platforms
- Accept PIB and probe cards from other testers directly
- Supports STDF data output and custom data formats
- Compact, air-cooled design for test head
Maintenance :
► Please re-calibrate after use for a certain period through our purchase store. Local Vietnam : SEMIKI CORP
DISTRIBUTED BY:
Semiki instrumentation Co., Ltd
Email: sales@semiki.com
Office tel: +84 28 2253 3522
~DOING OUR BEST FOR YOU~
