Product portfolio

SEMIKI measurement solution

Vision Camera System PCB function tester Chip loading machine Repair measuring equipment

Electronic industry measuring machine

Multi-channel data logger Standard AC/DC programmable power supply High voltage meter Insulation resistance tester Ground resistance meter Leakage current meter ESD measuring device Electrical characteristics analysis equipment Production room equipment

Force and mechanical measuring equipment

Force measuring device clamp set Force sensor Force measuring base Torque wrench Force measuring system Decibel Material thickness gauge Vibration meter Gas meter Mechanical force gauge Electronic force gauge Torque measuring machine Speed machine Device for measuring material hardness Power screwdriver

Measuring equipment for mechanical industry

Standard measuring tools Thread check conditioner Profile measuring machine Coating thickness gauge Quality testing machine Magnetic measuring device Altitude measure

Temperature and humidity measuring device

Temperature and humidity meter Substance concentration measuring device Detachable probe thermometer Infrared thermometer, thermal camera Self-recording thermometer

Optical measuring equipment

Industrial cameras Measurement microscope Digital microscope Stereo microscope Beam intensity meter Colorimeter Endoscopy equipment

Lab equipment

Desktop scale Technical scales Analytical balance Industrial floor scales Clean room equipment Spectroscopy and X-Ray equipment Simulation cabinets, drying cabinets, furnaces

Industrial microscope

Producer: NIKON Metrology

Category: Optical microscope

Motorized microscope with episcopic/diascopic illumination, which enables the control of objectives, light intensity, and observation method detection from the camera control unit

A motorized microscope with episcopic/diascopic illumination , which meets the various needs of observation, inspection, research, and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm

Modular microscope body applicable with various observations and tasks

Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam, interferometry observations. Furthermore, phase contrast and DIC observation with diascopic illumination are also possible.
It supports diverse and advanced research, analysis and inspection.

Compatible observation methods
	Brightfield	Darkfield	DIC	Fluorescence	Polarizing	Phase contrast	Two-beam interferometry
Episcopic						—
Diascopic				—			—

*Select suitable lens for each observation.

Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body

Objectives for brightfield observation (epi)

CFI60-2 series offers higher NA and longer working distances than ever before.

For more information, see the chart

Easy digital imaging

Combining the camera control unit with the LV100DA-U, allows greater information detection and control over a variety of key functions, including the use of objective lenses, light intensity of the illumination unit, aperture stop, observation method adjustment (brightfield/darkfield/fluorescence ) and magnification.
In addition, the information is automatically converted to appropriate calibration data when changing magnification.