FISCHER X-RAY XDAL-237 材料およびコーティング分析装置

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カテゴリー: 分光法およびX線装置

Dòng máy XRF Fischer XDAL series với Bóng Micro-focus X-Ray, đầu đo SDD thế hệ mới. Kèm theo bộ phần mềm WinFTM mới nhất từ Fischer sẽ đáp ứng trong việc đo lường độ dày xi mạ phức tạp nhất.
Phân tích thành phần nguyên tố hợp kim ( bao gồm đo tuổi vàng ), Phát hiện các nguyên tố kim loại nặng theo tiêu chuẩn RoHS. Hàm lượng kim loại trong dung dịch xi mạ…

FISCHERSCOPE X-RAY XDAL-237

X-Ray Fluorescence Measuring Instrument with a Programmable XY-Stage and Z-Axis for Automated
Measurements of thin Coatings and for Material Analysis.

The FISCHERSCOPE X-RAY XDAL 237 is universally applicable energy dispersive x-ray fluorescence measuring instrument.

It is especially well suited for non-destructive measurements and analysing very thin coatings,

even with very complex compositions or small concentrations as well as automated measurement tasks.
With the fast, programmable XY-stage, it is the fitting measuring instrument for automated measurements in quality assurance and production monitoring.

Typical areas of application are:

• Analysis of thin or very thin coatings, e.g., gold and palladium coatings of ≤ 0.1 μm
• Measurement of functional coatings in the electronics and semiconductor industries
• Determination of complex multi-coating systems
• Automated measurements, e.g., in quality control
• Determination of the lead content in solder

The measurements of the plating thickness include

but are not limited to the following plating stack-up combinations:

Electroless Nickel / Immersion Gold (ENIG)
Gold / Palladium / Nickel / Copper
Immersion Tin / Copper
Immersion Silver / Copper
Tin-Lead / Copper

Picture: X-ray XDLA-237 At the semiki’s warehouse

Standards :

– CE approval EN 61010
– X-Ray standards DIN ISO 3497 and ASTM B 568
– Approval Fully protected instrument with type approval according to the German regulations .