The World’s Most Trusted Probes and Interconnect Products.
Conventional In-Circuit/Functional (ICT/FCT) Probes
For in-circuit or functional testing of loaded or bare printed circuit boards. QA-TECH offers an extensive line of products, ranging in size from 0.025 0.63 to 0.187 4.75 center spacing, with a wide selection of tip styles and spring forces for your specific application.
QA Tech U.S.A
Conventional In-Circuit/Functional (ICT/FCT) Probes
The World’s Most Trusted Probes and Interconnect Products.
• The in-circuit test (ICT) involves the measurement of all individual components of an assembly. Defective components are detected and can be replaced if necessary.
• The function test (FCT) checks an assembly functions 100 percent as intended.
• The testing environment simulates the intended field of application and the electrical behaviour of the assembly is tested.
• A multitude of different test probes are available for the optimal fulfilment of the contacting task.
• These differ in installation height, grid size (possible distance between probes), tip style, and connection type.
• The electrical connection is often made via a solder cup, a wire-wrap post, as well as with or without cable.
QA-Tech offers various test probes depending on the assembly (PCB) to be contacted and the ambient condition
Conventional In-Circuit/Functional (ICT/FCT) Probes
► For in-circuit or functional testing of loaded or bare printed circuit boards.
QA-TECH offers an extensive line of products, ranging in size from 0.025 0.63 to 0.187 4.75 center spacing, with a wide selection of tip styles and spring forces for your specific application.
Video: QA Technology Conventional Probe and Socket | installation and Extraction
仕様
100-MIL Series
Picture: QA Tech U.S.A Test Probes 100-PRG2508H-S at Semiki’s warehouse
Picture: QA Tech U.S.A Test Probes 100-PRG2519H at Semiki’s warehouse
メンテナンスと校正:
► 一定期間ご使用後は、弊社購入店にて再メンテナンスをお願い致します。 ベトナム現地：SEMIKI CORP
配布元:
セミキ計装株式会社
電子メール: sales@semiki.com
オフィス電話: +84 28 2253 3522
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